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Dynamic Secondary Ion Mass Spectrometry (SIMS) uses a continuous, focused beam of primary ions to remove material from the surface of a sample by sputtering. The fraction of sputtered material that is ionized is extracted into a double-focusing mass spectrometer, which uses electrostatic and ...
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electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an
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